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AICCSA
2008
IEEE
209views Hardware» more  AICCSA 2008»
13 years 6 months ago
Transistor-level based defect tolerance for reliable nanoelectronics
Nanodevices based circuit design will be based on the acceptance that a high percentage of devices in the design will be defective. In this work, we investigate a defect tolerant ...
Aiman H. El-Maleh, Bashir M. Al-Hashimi, Aissa Mel...
DSN
2007
IEEE
13 years 11 months ago
Fault Tolerant Approaches to Nanoelectronic Programmable Logic Arrays
Programmable logic arrays (PLA), which can implement arbitrary logic functions in a two-level logic form, are promising as platforms for nanoelectronic logic due to their highly r...
Wenjing Rao, Alex Orailoglu, Ramesh Karri
DAC
2004
ACM
14 years 6 months ago
Defect tolerant probabilistic design paradigm for nanotechnologies
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
Margarida F. Jacome, Chen He, Gustavo de Veciana, ...
ICPR
2004
IEEE
14 years 6 months ago
From Massively Parallel Image Processors to Fault-Tolerant Nanocomputers
Parallel processors such as SIMD computers have been successfully used in various areas of high performance image and data processing. Due to their characteristics of highly regula...
Jie Han, Pieter Jonker
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
13 years 10 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...