116 search results - page 2 / 24 » Using Logic Models To Predict The Detection Behavior Of Stat... |
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The performance of deep sub-micron designs can be affected by various parametric variations, manufacturing defects, noise or even modeling errors that are all statistical in natur...
WOSS
2004
ACM
13 years 10 months ago
2004
ACM
Complex distributed Internet services form the basis not only of e-commerce but increasingly of mission-critical networkbased applications. What is new is that the workload and in...
BMCBI
2007
13 years 4 months ago
2007
Background: High-throughput peptide and protein identification technologies have benefited tremendously from strategies based on tandem mass spectrometry (MS/MS) in combination wi...
DAC
2006
ACM
14 years 5 months ago
2006
ACM
A statistical model for the purpose of logic cell timing analysis in the presence of process variations is presented. A new current-based cell delay model is utilized, which can a...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...