14 search results - page 3 / 3 » Using Process Simulation to Assess the Test Design Effort Re... |
TVLSI
2008
13 years 5 months ago
2008
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...
TASE
2008
IEEE
13 years 5 months ago
2008
IEEE
In this paper we deal with the problem of modeling railway networks with Petri nets so as to apply the theory of supervisory control for discrete event systems to automatically de...
TCAD
2008
13 years 5 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...