The functional validation of a state-of-the-art digital design is usually performed by simulation of a register-transfer-level model. The degree to which the testvector suite cove...
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
—In both pre-silicon and post-silicon validation, the detection of design errors requires both stimulus capable of activating the errors and checkers capable of detecting the beh...
We present a coverage metric which evaluates the testing of a set of interacting concurrent processes. Existing behavioral coverage metrics focus almost exclusively on the testing...
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...