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» Validation coverage analysis for complex digital designs
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DATE
2007
IEEE
155views Hardware» more  DATE 2007»
13 years 11 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
13 years 11 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
CODES
2008
IEEE
13 years 7 months ago
Specification-based compaction of directed tests for functional validation of pipelined processors
Functional validation is a major bottleneck in microprocessor design methodology. Simulation is the widely used method for functional validation using billions of random and biase...
Heon-Mo Koo, Prabhat Mishra
ICCAD
1999
IEEE
84views Hardware» more  ICCAD 1999»
13 years 9 months ago
Improving coverage analysis and test generation for large designs
State space techniques have proven to be useful for measuring and improving the coverage of test vectors that are used during functional validation via simulation. By comparing th...
Jules P. Bergmann, Mark Horowitz
GLVLSI
2008
IEEE
157views VLSI» more  GLVLSI 2008»
13 years 12 months ago
Coverage-driven automatic test generation for uml activity diagrams
Due to the increasing complexity of today’s embedded systems, the analysis and validation of such systems is becoming a major challenge. UML is gradually adopted in the embedded...
Mingsong Chen, Prabhat Mishra, Dhrubajyoti Kalita