30 search results - page 5 / 6 » Variability in nanometer CMOS: Impact, analysis, and minimiz... |
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
Abstract— Design variability due to within-die and die-todie process variations has the potential to significantly reduce the maximum operating frequency and the effective yield...
ICCAD
2001
IEEE
14 years 3 months ago
2001
IEEE
The use of nanometer technologies is making it increasingly important to consider transient characteristics of a circuit’s power dissipation (e.g., peak power, and power gradien...
DAC
2004
ACM
14 years 7 months ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
DAC
2004
ACM
13 years 10 months ago
2004
ACM
The ability to control the variations in IC fabrication process is rapidly diminishing as feature sizes continue towards the sub-100 nm regime. As a result, there is an increasing...
DAC
2009
ACM
14 years 1 months ago
2009
ACM
Manufacturing process variability impacts the performance of synchronous logic circuits by means of its effect on both clock network and functional block delays. Typically, varia...