14 search results - page 3 / 3 » WTA: waveform-based timing analysis for deep submicron circu... |
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
Analyzing the effect of crosstalk on delay is critical for high performance circuits. The major bottleneck in performing crosstalkinduced delay analysis is the high computational ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Process variations cause significant timing uncertainty and yield degradation in deep sub-micron technologies. A solution to counter timing uncertainty is post-silicon clock t...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
In deep submicron VLSI circuits, interconnect reliability due to electromigration and thermal effects is fast becoming a serious design issue particularly for long signal lines. T...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...