2181 search results - page 1 / 437 » When Can We Test Less |
METRICS
2003
IEEE
13 years 10 months ago
2003
IEEE
When it is impractical to rigorously assess all parts of complex systems, test engineers use defect detectors to focus their limited resources. In this article, we define some pr...
EDM
2010
13 years 3 months ago
2010
Dynamic assessment (DA) has been advocated as an interactive approach to conduct assessments to students in the learning systems as it can differentiate student proficiency at a fi...
SIGIR
2009
ACM
13 years 11 months ago
2009
ACM
In numerous everyday domains, it has been demonstrated that increasing the number of options beyond a handful can lead to paralysis and poor choice and decrease satisfaction with ...
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
It is widely recognized that device and interconnect fabrics at the nanoscale will be characterized by an increased susceptibility to transient faults. This appears to be intrinsi...
DAGSTUHL
2006
13 years 6 months ago
2006
An objective definition of what a code clone is currently eludes the field. A small study was performed at an international workshop to elicit judgments and discussions from world ...