Sciweavers

16 search results - page 1 / 4
» Wrapper Design for the Reuse of Networks-on-Chip as Test Acc...
Sort
View
ETS
2006
IEEE
113views Hardware» more  ETS 2006»
13 years 11 months ago
Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism
This paper proposes a wrapper design for interconnects with guaranteed bandwidth and latency services and on-chip protocol. strate that these interconnects abstract the interconne...
Alexandre M. Amory, Kees Goossens, Erik Jan Marini...
ET
2002
90views more  ET 2002»
13 years 4 months ago
Test Wrapper and Test Access Mechanism Co-Optimization for System-on-Chip
Test access mechanisms (TAMs) and test wrappers are integral parts of a system-on-chip (SOC) test architecture. Prior research has concentrated on only one aspect of the TAM/wrappe...
Vikram Iyengar, Krishnendu Chakrabarty, Erik Jan M...
DAC
2008
ACM
14 years 6 months ago
On reliable modular testing with vulnerable test access mechanisms
In modular testing of system-on-a-chip (SoC), test access mechanisms (TAMs) are used to transport test data between the input/output pins of the SoC and the cores under test. Prio...
Lin Huang, Feng Yuan, Qiang Xu
ITC
2000
IEEE
124views Hardware» more  ITC 2000»
13 years 9 months ago
Wrapper design for embedded core test
A wrapper is a thin shell around the core, that provides the switching between functional, and core-internal and core-external test modes. Together with a test access mechanism (T...
Yervant Zorian, Erik Jan Marinissen, Maurice Lousb...
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
13 years 5 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen