Sciweavers

    110 search results - page 3 / 22
    » aspdac 2005
    Sort
    View
    ASPDAC
    2005
    ACM
    74views Hardware» more  ASPDAC 2005»
    On-chip thermal gradient analysis and temperature flattening for SoC design
    13 years 7 months ago
    On-chip thermal gradient analysis and temperature flattening for SoC design
    Download  www-ise2.ist.osaka-u.ac.jp
    Takashi Sato, Junji Ichimiya, Nobuto Ono, Koutaro ...
    claim paper
    Read More »
    ASPDAC
    2005
    ACM
    107views Hardware» more  ASPDAC 2005»
    Customized on-chip memories for embedded chip multiprocessors
    13 years 7 months ago
    Customized on-chip memories for embedded chip multiprocessors
    Download  camars.kaist.ac.kr
    Ozcan Ozturk, Mahmut T. Kandemir, G. Chen, Mary Ja...
    claim paper
    Read More »
    ASPDAC
    2005
    ACM
    123views Hardware» more  ASPDAC 2005»
    Supporting sequential assumptions in hybrid verification
    13 years 11 months ago
    Supporting sequential assumptions in hybrid verification
    Download  research.synopsys.com
    Eduard Cerny, Ashvin Dsouza, Kevin Harer, Pei-Hsin...
    claim paper
    Read More »
    ASPDAC
    2005
    ACM
    89views Hardware» more  ASPDAC 2005»
    Multi-metric and multi-entity characterization of applications for early system design exploration
    13 years 11 months ago
    Multi-metric and multi-entity characterization of applications for early system design exploration
    Download  www.cecs.uci.edu
    — At system level, intensively analyzing the system application will produce a variety of useful characteristics and provide designers valuable exploration indications. In this p...
    Lukai Cai, Andreas Gerstlauer, Daniel Gajski
    claim paper
    Read More »
    ASPDAC
    2005
    ACM
    142views Hardware» more  ASPDAC 2005»
    Bridging fault testability of BDD circuits
    13 years 7 months ago
    Bridging fault testability of BDD circuits
    Download  www.informatik.uni-bremen.de
    Abstract— In this paper we study the testability of circuits derived from Binary Decision Diagrams (BDDs) under the bridging fault model. It is shown that testability can be form...
    Junhao Shi, Görschwin Fey, Rolf Drechsler
    claim paper
    Read More »
    Explore & Download
    Proceedings Preprints Top 5 Ranked Papers Publications Books Software Tutorials Presentations Lectures Notes Datasets
    Productivity Tools
    International On-screen Keyboard Graphical Social Symbols OCR Text Recognition CSS3 Style Generator Web Page to PDF Web Page to Image PDF Split PDF Merge Latex Equation Editor Sci2ools
    Document Tools
    PDF to Text PDF to Postscript PDF to Thumbnails Excel to PDF Word to PDF Postscript to PDF PowerPoint to PDF Latex to Word Repair Corrupted PDF
    Image Tools
    JPG to PS JPG to PDF Extract Images from PDF Image Converter
    Sciweavers
    About Community Cookies Privacy Policy Terms of Use

    Copyright © Sciweavers LLC, 2009-2024, USA.