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ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
Recent probabilistic test generation approaches have proven that detecting single stuck-at faults multiple times is effective at reducing the defective part level (DPL). Unfortuna...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
We present a framework for high-level design validation using an efficient register-transfer level (RTL) automatic test pattern generator (ATPG). The RTL ATPG generates the test ...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
ATS
2003
IEEE
13 years 11 months ago
2003
IEEE
Domain testing is a well-known software testing technique. Although research tasks have been initiated in domain testing, automatic test data generation based on character string ...
ATS
2003
IEEE
13 years 9 months ago
2003
IEEE
We propose an embedded processor-based built-in self-repair (BISR) design for embedded memories. In the proposed design we reuse the embedded processor that can be found on almost...