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ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
ATS
2009
IEEE
13 years 9 months ago
2009
IEEE
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
As diagnostic testing for memory devices increasingly gains in importance, companies are looking for flexible, cost effective methods to perform diagnostics on their failing devi...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
High performance designs often use the on-chip device PLLs for accurate test clock generation during testing. The on-chip clock generator is designed in a programmable way to faci...