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ATS
2009
IEEE
14 years 18 days ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
ATS
2009
IEEE
13 years 11 months ago
2009
IEEE
Caches are crucial components in modern processors (both stand-alone or integrated into SoCs) and their test is a challenging task, especially when addressing complex and high-fre...
ATS
2009
IEEE
13 years 3 months ago
2009
IEEE
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time a...
IJRR
2008
13 years 5 months ago
2008
jr.sagepub.com/cgi/content/abstract/27/6/737 The online version of this article can be found at: Published by: http://www.sagepublications.com On behalf of: Multimedia Archives can...
ICIP
2009
IEEE
13 years 3 months ago
2009
IEEE
This paper presents a new method for extracting roads in Very High Resolution remotely sensed images based on advanced directional morphological operators. The proposed approach i...