21 search results - page 2 / 5 » ddecs 2007 |
DDECS
2007
IEEE
13 years 7 months ago
2007
IEEE
— From an assumed property, which constrains the inputs of a design under test, we produce a RTL synthesizable design that generates compliant sequences of values for all the sig...
DDECS
2007
IEEE
14 years 3 days ago
2007
IEEE
— Recently, there is a renewed interest in Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT). This results from the availability of very powerful SA...
DDECS
2007
IEEE
14 years 3 days ago
2007
IEEE
– The implementation and the fault simulation technique for the highly reliable digital design using two FPGAs under a processor control is presented. Two FPGAs are used for dupl...
DDECS
2007
IEEE
13 years 6 months ago
2007
IEEE
—A Low noise and low power CMOS Image Sensor (CIS) with pixel-level Correlated Double Sampling (CDS) is proposed. As the pixel readout circuit using source follower is major read...
DDECS
2007
IEEE
14 years 3 days ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...