15 search results - page 3 / 3 » dft 1999 |
ITC
1999
IEEE
13 years 9 months ago
1999
IEEE
The embedded core testing methodology at Advanced Micro Devices Inc. involves adopting a disciplined system for developing new products with a focus on time to market and engineer...
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
DATE
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents a new Design for Testability (DFT) technique for Current-Mode Logic (CML) circuits. This new technique, with little overhead, using built-in detectors, monitor...
GLVLSI
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper proposes a new fault coverage estimation model which can be used in the early stage of VLSI design. The fault coverage model is an exponentially decaying function with ...
ICIP
1999
IEEE
13 years 9 months ago
1999
IEEE
by 0. In the discrete Fourier transform (DFT) domain, We propose a hybrid approach to wavelet-based image deconvolution that comprises Fourier-domain system inversion followed by w...