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ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
ICCAD
2002
IEEE
14 years 1 months ago
2002
IEEE
With increasing design sizes and adoption of System on a Chip (SoC) methodology, design synthesis and test automation tools are hitting capacity and performance bottlenecks. Curre...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
IDDQ test loses its effectiveness for deep sub-micron chips since it cannot distinguish between faulty and fault-free currents. The concept of current ratios, in which the ratio o...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
A novel approach for reducing power consumption in checkers used for concurrent error detection is presented. Spatial correlations between the outputs of the circuit that drives t...