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DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper we will introduce a novel approach for the on-chip generation of a faulttolerant clock. We will motivate why it becomes more and more desirable to provide VLSI circu...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
A Fault Tolerant Active Pixel Sensor (FTAPS) has been designed and fabricated to correct for point defects that occur in CMOS image sensors both at manufacturing and over the life...
DFT
2006
IEEE
13 years 8 months ago
2006
IEEE
With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the pho...
DELTA
2006
IEEE
13 years 11 months ago
2006
IEEE
In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string Digital/Analog converter(DAC). The results show that a...
DFT
2006
IEEE
13 years 11 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...