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DFT
2006
IEEE

Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects

9 years 5 months ago
Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects
With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect-tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect avoidance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations.
Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim
Added 22 Aug 2010
Updated 22 Aug 2010
Type Conference
Year 2006
Where DFT
Authors Yadunandana Yellambalase, Minsu Choi, Yong-Bin Kim
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