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ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
A scan-based BIST scheme is presented which guarantees complete fault coverage with very low hardware overhead. A probabilistic analysis shows that the output of an LFSR which fee...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
Although numerous methods have been proposed for interconnect simulation, no single model exists for all kind of transmission line problems. This paper presents a new, single, gen...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
While numerous power optimization techniques have been at all levels of design process abstractions for electronic components, until now, power minimization in mixed mechanical-el...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
We propose a new method for generating BDDs from hardware algorithm descriptions written in a programming language. Our system can deal with control structures, such as conditiona...
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
State justification is a time-consuming operation in test generation for sequential circuits. In this paper, we present a technique to rapidly identify state elements (flip-flops)...