Sciweavers

83 search results - page 17 / 17
» ics 2003
Sort
View
ITC
2003
IEEE
136views Hardware» more  ITC 2003»
13 years 10 months ago
Adapting JTAG for AC Interconnect Testing
The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that h...
Lee Whetsel
ISPD
2003
ACM
110views Hardware» more  ISPD 2003»
13 years 10 months ago
Explicit gate delay model for timing evaluation
Delay evaluation is always a crucial concern in the VLSI design and it becomes increasingly more critical in the nowadays deep-submicron technology. To obtain an accurate delay va...
Muzhou Shao, Martin D. F. Wong, Huijing Cao, Youxi...
AAAI
2010
13 years 6 months ago
A Two-Dimensional Topic-Aspect Model for Discovering Multi-Faceted Topics
This paper presents the Topic-Aspect Model (TAM), a Bayesian mixture model which jointly discovers topics and aspects. We broadly define an aspect of a document as a characteristi...
Michael Paul, Roxana Girju