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CORR
2007
Springer
74views Education» more  CORR 2007»
13 years 5 months ago
Packaging of RF Mems Switching Functions on Alumina Substrate
The expending development of wireless communication requires strong demands for components with improved capabilities. RF MEMS devices offer a variable alternative to conventional...
M.-K. El Khatib, Arnaud Pothier, Pierre Blondy
ICCAD
2007
IEEE
124views Hardware» more  ICCAD 2007»
14 years 2 months ago
3D-STAF: scalable temperature and leakage aware floorplanning for three-dimensional integrated circuits
Abstract— Thermal issues are a primary concern in the threedimensional (3D) integrated circuit (IC) design. Temperature, area, and wire length must be simultaneously optimized du...
Pingqiang Zhou, Yuchun Ma, Zhuoyuan Li, Robert P. ...
CODES
2007
IEEE
13 years 12 months ago
ESL design and HW/SW co-verification of high-end software defined radio platforms
Multiple wireless technologies are converging to run on personal handhelds. The plethora of communication standards next to the cost issues of deeper submicron processing require ...
A. C. H. Ng, J. W. Weijers, Miguel Glassee, Thomas...
DATE
2007
IEEE
146views Hardware» more  DATE 2007»
13 years 12 months ago
DFM/DFY: should you trust the surgeon or the family doctor?
Everybody agrees that curing DFM/DFY issues is of paramount importance at 65 nanometers and beyond. Unfortunately, there is disagreement about how and when to cure them. “Surgeo...
Marco Casale-Rossi, Andrzej J. Strojwas, Robert C....
DATE
2007
IEEE
86views Hardware» more  DATE 2007»
13 years 12 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer