7 search results - page 1 / 2 » iolts 2005 |
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper proposes a new test pattern generator (TPG) which is an enhancement of GLFSR (Galois LFSR). This design is based on certain non–binary error detecting codes, formulat...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
With the aggressive scaling of the CMOS technology parametric variation of the transistor threshold voltage causes significant spread in the circuit delay as well as leakage spect...
IOLTS
2005
IEEE
13 years 10 months ago
2005
IEEE
Selecting a strong cryptographic algorithm makes no sense if the information leaks out of the device through sidechannels. Sensitive information, such as secret keys, can be obtai...