Polymorphic gates can be considered as a new reconfigurable technology capable of integrating logic functions with sensing in a single compact structure. Polymorphic gates whose ...
With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this pr...
Julien Vial, Alberto Bosio, Patrick Girard, Christ...
An efficient on-chip infrastructure for memory test and repair is crucial to enhance yield and availability of SoCs. Most of the existing built-in self-repair solutions reuse IP-C...
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...
In this paper, we propose a new SystemC-based fault injection technique that has improved fault representation in visible and on-the-fly data and signal registers. The technique ...
Rishad A. Shafik, Paul M. Rosinger, Bashir M. Al-H...