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ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
Implementing a built-in self-test by a "test per clock" scheme offers advantages concerning fault coverage, detection of delay faults, and test application time. Such a ...
ISCAS
1995
IEEE
13 years 8 months ago
1995
IEEE
Abstract— This paper describes a new first and secondorder delta-sigma modulator (DSM) concept where the first integrator is extracted and implemented by a FM oscillator with t...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...