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ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Static timing analysis is a critical step in design of any digital integrated circuit. Technology and design trends have led to significant increase in environmental and process v...
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
In the previous work, the problem of nding gate delays to eliminate glitches has been solved by linear programs (LP) requiring an exponentially large number ofconstraints. By intr...
ICCD
2003
IEEE
14 years 1 months ago
2003
IEEE
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
—We present a dictionary-based test data compression approach for reducing test data volume and testing time in SOCs. The proposed method is based on the use of a small number of...