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DFT
2006
IEEE
13 years 7 months ago
2006
IEEE
As the technology enters the nano dimension, the inherent unreliability of nanoelectronics is making fault-tolerant architectures increasingly necessary in building nano systems. ...
EAAI
2007
13 years 5 months ago
2007
This paper presents a swarm intelligence based approach to optimally partition combinational CMOS circuits for pseudoexhaustive testing. The partitioning algorithm ensures reducti...
JAIR
2010
13 years 3 months ago
2010
Model-based diagnostic reasoning often leads to a large number of diagnostic hypotheses. The set of diagnoses can be reduced by taking into account extra observations (passive mon...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
DAC
2006
ACM
14 years 6 months ago
2006
ACM
Existing approaches to timing analysis under uncertainty are based on restrictive assumptions. Statistical STA techniques assume that the full probabilistic distribution of parame...