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ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 4 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
SAC
2006
ACM
14 years 4 months ago
Interval-based robust statistical techniques for non-negative convex functions, with application to timing analysis of computer
: In chip design, one of the main objectives is to decrease its clock cycle; however, the existing approaches to timing analysis under uncertainty are based on fundamentally restri...
Michael Orshansky, Wei-Shen Wang, Martine Ceberio,...
EAAI
2006
189views more  EAAI 2006»
13 years 10 months ago
Evolutionary algorithms for VLSI multi-objective netlist partitioning
The problem of partitioning appears in several areas ranging from VLSI, parallel programming, to molecular biology. The interest in finding an optimal partition especially in VLSI ...
Sadiq M. Sait, Aiman H. El-Maleh, Raslan H. Al-Aba...