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ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Negative bias temperature instability (NBTI) has come to the forefront of critical reliability phenomena in advanced CMOS technology. In this paper, we propose a fast and accurate...
ISQED
2007
IEEE
13 years 11 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...
VTS
2007
IEEE
13 years 11 months ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
SARA
2007
Springer
13 years 11 months ago
2007
Springer
Most algorithms for computing diagnoses within a modelbased diagnosis framework are deterministic. Such algorithms guarantee soundness and completeness, but are NPhard. To overcom...
ASPDAC
2007
ACM
13 years 9 months ago
2007
ACM
Power supply noise increases the circuit delay, which may lead to performance failure of a design. Decoupling capacitance (decap) addition is effective in reducing the power suppl...