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PATMOS
2007
Springer
13 years 10 months ago
2007
Springer
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
ASPDAC
2007
ACM
13 years 8 months ago
2007
ACM
- Two methods to apply tests to detect delay faults in standard scan designs are used. One is called launch off capture and the other is called launch off shift. Launch off shift t...
DDECS
2007
IEEE
13 years 8 months ago
2007
IEEE
A method of generating test pairs for the delay faults is presented in this paper. The modification of the MISR register gives the source of test pairs. The modification of this r...
GLVLSI
2007
IEEE
13 years 8 months ago
2007
IEEE
Reliability modeling and evaluation is expected to be one of the major issues in emerging nano-devices and beyond 22nm CMOS. Such devices would have inherent propensity for gate f...