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    ISQED
    2007
    IEEE
    146views Hardware» more  ISQED 2007»
    An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization
    13 years 11 months ago
    An Exploratory Study on Statistical Timing Analysis and Parametric Yield Optimization
    Download  www.extreme-da.com
    Ayhan A. Mutlu, Kelvin J. Le, Mustafa Celik, Dar-s...
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    ISQED
    2007
    IEEE
    136views Hardware» more  ISQED 2007»
    A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
    13 years 11 months ago
    A Data-Driven Statistical Approach to Analyzing Process Variation in 65nm SOI Technology
    Download  www.cs.pitt.edu
    Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
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    ISQED
    2007
    IEEE
    182views Hardware» more  ISQED 2007»
    Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
    13 years 11 months ago
    Defect or Variation? Characterizing Standard Cell Behavior at 90nm and below
    Download  infocenter.arm.com
    Historically, design margin and defects have been viewed as different topics, one part of design and the other part of test. Shrinking process geometries are making the two part o...
    Robert C. Aitken
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    ISQED
    2007
    IEEE
    187views Hardware» more  ISQED 2007»
    High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal I
    13 years 11 months ago
    High-Frequency-Measurement-Based Frequency-Variant Transmission Line Characterization and Circuit Modeling for Accurate Signal I
    Download  giga.hanyang.ac.kr
    Novel experimental characterization method and circuit modeling for frequency-variant transmission lines are presented. Experimental test patterns are designed and fabricated by u...
    Hyunsik Kim, Yungseon Eo
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    ISQED
    2007
    IEEE
    116views Hardware» more  ISQED 2007»
    MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments
    13 years 11 months ago
    MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments
    Download  www.dtc.umn.edu
    We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
    Christian J. Hescott, Drew C. Ness, David J. Lilja
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