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ISQED
2009
IEEE
14 years 7 days ago
2009
IEEE
— With continued scaling, reliability is emerging as a critical challenge for the designers of digital circuits. The challenge stems in part from the lack of computationally efï¬...
ISQED
2009
IEEE
14 years 7 days ago
2009
IEEE
An outstanding challenge for realizing nanoelectronic systems is nano-interface design, i.e., how to precisely access a nanoscale wire in an array for communication between a nano...
ISQED
2009
IEEE
14 years 7 days ago
2009
IEEE
Abstract — Nanoelectronic design faces unprecedented reliability challenges and must achieve noise immunity and delay insensitiveness in the presence of prevalent defects and sig...
ISQED
2009
IEEE
14 years 7 days ago
2009
IEEE
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
ISQED
2009
IEEE
14 years 7 days ago
2009
IEEE
The advance in semiconductor technologies presents the serious problem of parameter variations. They affect threshold voltage of transistors and thus circuit delay has variability...