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14
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itc 1996
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ITC
1996
IEEE
432
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ITC 1996
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Standard Test Interface Language (STIL): A New Language for Patterns and Waveforms
13 years 9 months ago
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www.itcprogramdev.org
Anthony Taylor, Gregory A. Maston
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ITC
1996
IEEE
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ITC 1996
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Identification and Test Generation for Primitive Faults
13 years 9 months ago
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cadlab.ece.ucsb.edu
Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakrad...
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ITC
1996
IEEE
94
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ITC 1996
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An ATPG-Based Framework for Verifying Sequential Equivalence
13 years 9 months ago
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cadlab.ece.ucsb.edu
Shi-Yu Huang, Kwang-Ting Cheng, Kuang-Chien Chen, ...
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ITC
1996
IEEE
114
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ITC 1996
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A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
13 years 9 months ago
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The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
Keith Lofstrom
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ITC
1996
IEEE
96
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ITC 1996
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A Roadmap for Boundary-Scan Test Reuse
13 years 9 months ago
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This paper proposes a Layered Model for boundaryscan testing to help identify opportunities for standardization. Serial Vector Format [1] and an accompanying Application Programmi...
D. Eugene Wedge, Tom Conner
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