A Demonstration IC for the P1149.4 Mixed-Signal Test Standard

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The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.

Keith Lofstrom

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Boundary Scan Standard | Characterization Data | CMOS Integrated Circuit | Hardware | ITC 1996 |

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Added	07 Aug 2010
Updated	07 Aug 2010
Type	Conference
Year	1996
Where	ITC
Authors	Keith Lofstrom

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A Demonstration IC for the P1149.4 Mixed-Signal Test Standard

Boundary Scan Standard | Characterization Data | CMOS Integrated Circuit | Hardware | ITC 1996 |

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