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ITC
2002
IEEE
88views Hardware» more  ITC 2002»
13 years 10 months ago
Embedded Deterministic Test for Low-Cost Manufacturing Test
Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan...
ITC
2002
IEEE
99views Hardware» more  ITC 2002»
13 years 10 months ago
Verifying Properties Using Sequential ATPG
This paper develops a novel approach for formally verifying both safety and liveness properties of designs using sequential ATPG tools. The properties are automatically mapped int...
Jacob A. Abraham, Vivekananda M. Vedula, Daniel G....
ITC
2002
IEEE
102views Hardware» more  ITC 2002»
13 years 10 months ago
Fault Grading FPGA Interconnect Test Configurations
Conventional fault simulation techniques for FPGAs are very complicated and time consuming. The other alternative, FPGA fault emulation technique, is incomplete, and can be used o...
Mehdi Baradaran Tahoori, Subhasish Mitra, Shahin T...
ITC
2002
IEEE
83views Hardware» more  ITC 2002»
13 years 10 months ago
Packet-Based Input Test Data Compression Techniques
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The techni...
Erik H. Volkerink, Ajay Khoche, Subhasish Mitra
ITC
2002
IEEE
135views Hardware» more  ITC 2002»
13 years 10 months ago
Test Coverage: What Does It Mean When a Board Test Passes?
ct Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that...
Kathy Hird, Kenneth P. Parker, Bill Follis