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ITC
2003
IEEE
136views Hardware» more  ITC 2003»
13 years 10 months ago
Adapting JTAG for AC Interconnect Testing
The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that h...
Lee Whetsel
ITC
2003
IEEE
148views Hardware» more  ITC 2003»
13 years 10 months ago
HyAC: A Hybrid Structural SAT Based ATPG for Crosstalk
As technology evolves into the deep sub-micron era, signal integrity problems are growing into a major challenge. An important source of signal integrity problems is the crosstalk...
Xiaoliang Bai, Sujit Dey, Angela Krstic
ITC
2003
IEEE
157views Hardware» more  ITC 2003»
13 years 10 months ago
Parity-Based Concurrent Error Detection in Symmetric Block Ciphers
Deliberate injection of faults into cryptographic devices is an effective cryptanalysis technique against symmetric and asymmetric encryption. We will describe a general concurren...
Ramesh Karri, Grigori Kuznetsov, Michael Göss...
ITC
2003
IEEE
151views Hardware» more  ITC 2003»
13 years 10 months ago
Fault Collapsing via Functional Dominance
A fault fj is said to dominate another fault fi if all tests for fi detect fj . When two faults dominate each other, they are called equivalent. Dominance and equivalence relation...
Vishwani D. Agrawal, A. V. S. S. Prasad, Madhusuda...
ITC
2003
IEEE
168views Hardware» more  ITC 2003»
13 years 10 months ago
A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually occupy a significant portion of the chip area, and do...
Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen ...