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ICCAD
2008
IEEE
129views Hardware» more  ICCAD 2008»
14 years 6 days ago
Path-RO: a novel on-chip critical path delay measurement under process variations
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Dat...
IOLTS
2008
IEEE
83views Hardware» more  IOLTS 2008»
14 years 4 days ago
On the Minimization of Potential Transient Errors and SER in Logic Circuits Using SPFD
Sets of Pairs of Functions to be Distinguished (SPFD) is a functional flexibility representation method that was recently introduced in the logic synthesis domain, and promises s...
Sobeeh Almukhaizim, Yiorgos Makris, Yu-Shen Yang, ...
ISVLSI
2008
IEEE
142views VLSI» more  ISVLSI 2008»
14 years 4 days ago
A Fuzzy Approach for Variation Aware Buffer Insertion and Driver Sizing
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
Venkataraman Mahalingam, Nagarajan Ranganathan
TVLSI
2008
176views more  TVLSI 2008»
13 years 5 months ago
A Fuzzy Optimization Approach for Variation Aware Power Minimization During Gate Sizing
Abstract--Technology scaling in the nanometer era has increased the transistor's susceptibility to process variations. The effects of such variations are having a huge impact ...
Venkataraman Mahalingam, N. Ranganathan, J. E. Har...