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    2007
    127views Robotics» more  MR 2007»
    A comprehensive model for PMOS NBTI degradation: Recent progress
    13 years 4 months ago
    A comprehensive model for PMOS NBTI degradation: Recent progress
    Download  cobweb.ecn.purdue.edu
    Muhammad Ashraful Alam, Haldun Kufluoglu, D. Vargh...
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    MR
    2007
    102views Robotics» more  MR 2007»
    Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
    13 years 4 months ago
    Electrical measurements of voltage stressed Al2O3/GaAs MOSFET
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    Z. Tang, P. D. Ye, D. Lee, C. R. Wie
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    MR
    2007
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    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
    13 years 4 months ago
    Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly
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    The development of a simplified analytical model to describe the thermal history of a Printed Circuit Board assembly (PCA) during convective reflow soldering is described in this ...
    Nele Van Steenberge, Paresh Limaye, Geert Willems,...
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    MR
    2007
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    Cohesive zone modeling for structural integrity analysis of IC interconnects
    13 years 4 months ago
    Cohesive zone modeling for structural integrity analysis of IC interconnects
    Download  www.mate.tue.nl
    Due to the miniaturization of integrated circuits, their thermo-mechanical reliability tends to become a truly critical design criterion.
    B. A. E. van Hal, R. H. J. Peerlings, M. G. D. Gee...
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    MR
    2007
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    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    13 years 4 months ago
    Active ESD protection circuit design against charged-device-model ESD event in CMOS integrated circuits
    Download  www.ics.ee.nctu.edu.tw
    CDM ESD event has become the main ESD reliability concern for integrated-circuits products using nanoscale CMOS technology. A novel CDM ESD protection design, using self-biased cu...
    Shih-Hung Chen, Ming-Dou Ker
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