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TVLSI
2008
13 years 4 months ago
2008
Lifetime concerns for complex systems-on-a-chip (SoC) designs due to decreasing levels in reliability motivate the development of solutions to ensure reliable operation. A precurso...
TVLSI
2008
13 years 4 months ago
2008
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
TVLSI
2008
13 years 4 months ago
2008
Thermal hot spots and high temperature gradients degrade reliability and performance, and increase cooling costs and leakage power. In this paper, we explore the benefits of temper...
TVLSI
2008
13 years 4 months ago
2008
Exact approaches to combinational equivalence checking, such as automatic test pattern generation-based, binary decision diagrams (BDD)-based, satisfiability-based, and hybrid appr...
TVLSI
2008
2008
A Design Flow for Architecture Exploration and Implementation of Partially Reconfigurable Processors
13 years 4 months ago
During the last years, the growing application complexity, design, and mask costs have compelled embedded system designers to increasingly consider partially reconfigurable applica...