Sciweavers

96 search results - page 19 / 20
» vlsi 2010
Sort
View
TCAD
2010
136views more  TCAD 2010»
13 years 19 hour ago
Bounded Model Debugging
Design debugging is a major bottleneck in modern VLSI design flows as both the design size and the length of the error trace contribute to its inherent complexity. With typical des...
Brian Keng, Sean Safarpour, Andreas G. Veneris
ISCA
2010
IEEE
229views Hardware» more  ISCA 2010»
13 years 3 months ago
Understanding sources of inefficiency in general-purpose chips
Due to their high volume, general-purpose processors, and now chip multiprocessors (CMPs), are much more cost effective than ASICs, but lag significantly in terms of performance a...
Rehan Hameed, Wajahat Qadeer, Megan Wachs, Omid Az...
VLSISP
2010
140views more  VLSISP 2010»
13 years 3 months ago
A Split-Decoding Message Passing Algorithm for Low Density Parity Check Decoders
A Split decoding algorithm is proposed which divides each row of the parity check matrix into two or multiple nearly-independent simplified partitions. The proposed method signific...
Tinoosh Mohsenin, Bevan M. Baas
DATE
2010
IEEE
161views Hardware» more  DATE 2010»
13 years 10 months ago
Aging-resilient design of pipelined architectures using novel detection and correction circuits
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
Hamed F. Dadgour, Kaustav Banerjee
ICCAD
1997
IEEE
86views Hardware» more  ICCAD 1997»
13 years 9 months ago
Interconnect design for deep submicron ICs
Interconnect has become the dominating factor in determining circuit performance and reliability in deep submicron designs. In this embedded tutorial, we first discuss the trends...
Jason Cong, David Zhigang Pan, Lei He, Cheng-Kok K...