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VLSID
2007
IEEE
127views VLSI» more  VLSID 2007»
14 years 5 months ago
Scalable techniques and tools for reliability analysis of large circuits
Debayan Bhaduri, Sandeep K. Shukla, Paul Graham, M...
VLSID
2007
IEEE
120views VLSI» more  VLSID 2007»
14 years 5 months ago
VLSI Architecture for Matrix Inversion using Modified Gram-Schmidt based QR Decomposition
Chitranjan K. Singh, Sushma Honnavara Prasad, Pora...
VLSID
2007
IEEE
107views VLSI» more  VLSID 2007»
14 years 5 months ago
Ultra Low Voltage Operation with Bootstrap Scheme for Single Power Supply SOI-SRAM
Masaaki Iijima, Masayuki Kitamura, Masahiro Numa, ...
VLSID
2007
IEEE
94views VLSI» more  VLSID 2007»
14 years 5 months ago
A Reduced Complexity Algorithm for Minimizing N-Detect Tests
? We give a new recursive rounding linear programming (LP) solution to the problem of N-detect test minimzation. This is a polynomialtime solution that closely approximates the exa...
Kalyana R. Kantipudi, Vishwani D. Agrawal
VLSID
2007
IEEE
97views VLSI» more  VLSID 2007»
13 years 11 months ago
Embedded Support Vector Machine : Architectural Enhancements and Evaluation
In recent years, research and development in the field of machine learning and classification techniques have gained paramount importance. The future generation of intelligent e...
Soumyajit Dey, Monu Kedia, Niket Agarwal, Anupam B...