23 search results - page 2 / 5 » vlsid 2008 |
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Compared to subthreshold leakage, dynamic power is normally much less sensitive to the process variation due to its approximately linear relation to the process parameters. Howeve...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
In this work, for the first time, we present a physically based analytical threshold voltage model for omega gate silicon nanowire transistor. This model is developed for long cha...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Abstract-- With the continuous downscaling of CMOS technologies, the reliability has become a major bottleneck in the evolution of the next generation systems. Technology trends su...
VLSID
2008
IEEE
14 years 5 months ago
2008
IEEE
Today's customizable processors allow the designer to augment the base processor with custom accelerators. By choosing appropriate set of accelerators, designer can significa...