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VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
As the technology is shrinking toward 50 nm and the working frequency is going into multi gigahertz range, the effect of interconnects on functionality and performance of system-o...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
We present a novel analog checker that adjusts dynamically the error threshold to the magnitude of its input signals. We demonstrate that this property is crucial for accurate con...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage of pseudorandom testing. The seed corresponds to the initial state of the LFSR before filling the scan chain. The number of determinist...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...