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VTS
2007
IEEE
14 years 1 days ago
2007
IEEE
: Conventionally, path delay tests are derived in a delay-independent manner, which causes most faults to be robustly untestable. Many non-robust tests are found but, in practice, ...
VTS
2007
IEEE
14 years 1 days ago
2007
IEEE
Conventional error correcting code (ECC) schemes used in memories and caches cannot correct double bit errors caused by a single event upset (SEU). As memory density increases, mu...
VTS
2007
IEEE
14 years 1 days ago
2007
IEEE
The sensitivity of very deep submicron designs to supply voltage noise is increasing due to higher path delay variations and reduced noise margins with supply noise scaling. The s...
VTS
2007
IEEE
14 years 1 days ago
2007
IEEE
A methodology is presented for improving the amount of compression achieved by continuous-flow decompressors by using multiple ratios of scan chains to tester channels (i.e., expa...
VTS
2007
IEEE
14 years 1 days ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...