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    GLVLSI
    2003
    IEEE
    161views VLSI» more  GLVLSI 2003»
    TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
    13 years 10 months ago
    TEM-cell and surface scan to identify the electromagnetic emission of integrated circuits
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    The characterization as well as the control of the electromagnetic emission of integrated circuits is an important step in the design process of state of the art integrated circui...
    Timm Ostermann, Bernd Deutschmann
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