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ASPDAC
2010
ACM
135views Hardware» more  ASPDAC 2010»
13 years 3 months ago
Statistical timing verification for transparently latched circuits through structural graph traversal
Level-sensitive transparent latches are widely used in high-performance sequential circuit designs. Under process variations, the timing of a transparently latched circuit will ada...
Xingliang Yuan, Jia Wang
TVLSI
2008
105views more  TVLSI 2008»
13 years 4 months ago
Fast Estimation of Timing Yield Bounds for Process Variations
With aggressive scaling down of feature sizes in VLSI fabrication, process variation has become a critical issue in designs. We show that two necessary conditions for the "Max...
Ruiming Chen, Hai Zhou
DAC
2004
ACM
14 years 6 months ago
First-order incremental block-based statistical timing analysis
Chandramouli Visweswariah, K. Ravindran, K. Kalafa...