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    Statistical Modeling With the PSP MOSFET Model
    12 years 11 months ago
    Statistical Modeling With the PSP MOSFET Model
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    PSP and the backward propagation of variance (BPV) method are used to characterize the statistical variations of metal-oxide-semiconductor field effect transistors (MOSFETs). BPV s...
    Xin Li, Colin C. McAndrew, Weimin Wu, Samir Chaudh...
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