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    ITC
    1996
    IEEE
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    A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
    13 years 9 months ago
    A Demonstration IC for the P1149.4 Mixed-Signal Test Standard
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    The P1149.4 mixed-signal boundary scan standard is demonstrated with a CMOS integrated circuit. Design issues and characterization data are presented.
    Keith Lofstrom
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