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ET
2002
77views more  ET 2002»
13 years 5 months ago
Reusing Scan Chains for Test Pattern Decompression
The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test ar...
Rainer Dorsch, Hans-Joachim Wunderlich
CPM
2010
Springer
175views Combinatorics» more  CPM 2010»
13 years 10 months ago
Compression, Indexing, and Retrieval for Massive String Data
The field of compressed data structures seeks to achieve fast search time, but using a compressed representation, ideally requiring less space than that occupied by the original i...
Wing-Kai Hon, Rahul Shah, Jeffrey Scott Vitter