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ET
2002

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Reusing Scan Chains for Test Pattern Decompression

13 years 4 months ago

Reusing Scan Chains for Test Pattern Decompression

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The paper presents a method for testing a system-on-achip by using a compressed representation of the patterns on an external tester. The patterns for a certain core under test are decompressed by reusing scan chains of cores idle during that time. The method only requires a few additional gates in the wrapper, while the mission logic is untouched. Storage and bandwidth requirements for the ATE are reduced significantly.

Rainer Dorsch, Hans-Joachim Wunderlich

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Certain Core | Compressed Representation | ET 2002 | External Tester |

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Added	18 Dec 2010
Updated	18 Dec 2010
Type	Journal
Year	2002
Where	ET
Authors	Rainer Dorsch, Hans-Joachim Wunderlich

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