DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
In this paper, we present a software compilation approach for microprocessor/FPGA platforms that partitions a software binary onto custom hardware implemented in the FPGA. Our app...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Visual information processing will play an increasingly important role in future electronics systems. In many applications, e.g. video surveillance cameras, data throughput of mic...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Accurate timing analysis is key to efficient embedded system synthesis and integration. While industrial control software systems are developed using graphical models, such as Ma...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper describes the design of a smart sensor for label-free detection of DNA hybridization. The sensor is based on a direct electrical transduction principle: it measures imp...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Fast wireless access has rapidly become commonplace. Wireless access points and Hotspot servers are sprouting everywhere. Battery lifetime continues to be a critical issue in mobi...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
It is a hot research topic to eliminate irrelevant variables from counterexample, to make it easier to be understood. The BFL algorithm is the most effective counterexample minimi...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper introduces a new SAT solver that integrates logicbased reasoning and integer programming methods to systems of CNF and PB constraints. Its novel features include an eff...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Many SOCs today contain both digital and analog embedded cores. Even though the test cost for such mixed-signal SOCs is significantly higher than that for digital SOCs, most prio...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Our goal is to produce validation data that can be used as an efficient (pre) test set for structural stuck-at faults. In this paper, we detail an original test-oriented mutation ...